Reference
O. J. Gietelink, J. Ploeg, B. De Schutter,
and M. Verhaegen, "VEHIL: Test facility for fault management testing of
advanced driver assistance systems,"
Proceedings of the 10th
ITS World Congress, Madrid, Spain, 13 pp., Nov. 2003. Paper 2693.
Abstract
This paper presents the latest developments of the VEHIL facility, which aims
to make the development process of intelligent vehicles safer, cheaper and more
manageable. The main feature of VEHIL is that a complete intelligent vehicle
can be tested in a hardware-in-the-loop simulation environment. The use of
VEHIL will be illustrated by preliminary test results of a Pre-Crash System.
Furthermore, a methodological approach will be presented for the validation of
fault management systems for Advanced Driver Assistance Systems by fault
injection in VEHIL.
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BibTeX
@inproceedings{GiePlo:03-005,
author = {Gietelink, Olaf J. and Ploeg, Jeroen and De Schutter, Bart and
Verhaegen, Michel},
title = {{VEHIL}: {T}est Facility for Fault Management Testing of
Advanced Driver Assistance Systems},
booktitle = {Proceedings of the 10th ITS World Congress},
address = {Madrid, Spain},
month = nov,
year = {2003},
note = {Paper 2693}
}